Dave Leahy, Tom Whitfield has logged records in 5 patterns and Haavard Hvidsten, Julian Saether has logged records in 2 patterns.
They are competing for 1 record, and of these Dave Leahy, Tom Whitfield ranks better in 0 and Haavard Hvidsten, Julian Saether ranks better in 1.
Pattern | Dave Leahy, Tom Whitfield | Haavard Hvidsten, Julian Saether |
---|---|---|
15 ball 1 count | 61pc | 94pc |